Proceedings of the 10th Workshop on Quantum Solar Energy Conversion - (QUANTSOL'98)
March 8-14, 1998, Bad Hofgastein, Austria


High Resolution Auger Microprobe Analysis of CuInS2 - CuIn5S8 Lamellae: Eutectic Growth from a CuInS2 Melt

S. Fiechter(1), H.-J. Lewerenz(2), T. Wirth(3) and W. Kautek(3)

(1) Department for Solar Energetics, Hahn-Meitner-Institute

(2) Department of Interfaces, Hahn-Meitner-Institute
Glienicker Straáe 100, D-14109 Berlin, Germany

(3) Laboratory for Thin Film Technology, Federal Institute for Materials Research and Testing
Unter den Eichen 87, D-12205 Berlin, Germany

Compound semiconductors of chalcopyrite structure with high optical absorption coefficient (α = 10-5 cm-1) such as CuInX2 (X = S, Se) warrant interest as absorber materials for thin film solar cells. Solar cells up to 17 % and 11 % have been realized with polycristalline p- CuInSe2/n-CdS and p-CuInS2/n-CdS thin film junctions. Such efficiencies seem to represent the upper limit of polycrystalline systems.
Single crystals of adequate doping and geometry, however, may overcome this limit. Single crystalline (112)-oriented CuInS2 surfaces in the cm2-range can be obtained using a lamellar eutectic growth mechanism crystallizing a CuInS2 melt by horizontal gradient freeze in a temperature gradient ranging from 5 - 15 øC/cm under elevated argon pressure of ~20 bar.
In order to identify single crystalline lamellae, an analytical technique of ultimate lateral resolution was required. Auger microprobe analysis (AES) together with scanning electron microscopy SEM (Perkin-Elmer, PHI 595) could be applied on single lamellae edge faces with high resolution at Uac = 0.5 kV. Layer sequences were cut and polished perpendicular to the cleavage plane of the chalcopyrite matrix. Fig. 1 shows the lamellar nature of the sample with a matrix consisting of chalcopyrite and irregularly intergrown lamellae of an additional phase with at most 1.5 um thickness. Auger line scans with lateral resolution of less than 2 um show the semiquantitative distribution across the strata. Position 5 is due to a surface void which has been filled by undefined abraded materials during the polishing process. An Auger point analysis of the locations 1, 2, 3, 4 yielded the composition of an In-rich CuInS2 matrix and the stoichiometry of CuIn5S8 lamellae.
The appearance of 1.5 um thick lamellae of the spinel phase CuIn5S8 which are epitaxially intergrown with the CuInS2 matrix in the cubic [111] direction can only be explained assuming an incongruent melting point for CuInS2. Recent investigations of the phase relations in the CuS - InS and Cu2S - In2S3 join, respectivelly, confirm this assumption. The defect chemistry and the growth mechanism will be presented as well as the use of the growth pattern to improve the material for thin film solar cells.

Fig. 1 Secondary electron micrograph of a polished cross section of a CuInS2 - CuIn5S8 crystal fragment showing eutectic coupled growth features (above); Auger microprobe scanning analysis along the cross section (below).


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